Design and Performance of an Automated Production Test System for a Muon DetectorDate: 2016-10-11 Add to Google Calendar
Time: 3:30pm - 5:30pm
Location: Holmes Hall 389
Speaker: Bronson Edralin, candidate for MS, advisor: Gary Varner
Design and Performance of an Automated Production Test System for a 20,000 Channel Single-Photon, Sub Nanosecond Large Area Muon Detector
The successful physics program of the Belle experiment at KEK, Tsukuba, Japan, resulted in an upgrade of the KEKB collider and of the Belle detector. The expanded Belle II international collaboration, consisting of about 500 physicists from 100 institutions spread worldwide, aims to investigate the Standard Model of particle physics, more specifically in a search for rare B and D mason decays, and charge parity (CP) violation, by performing unprecedented precision measurements. University of Hawaii at Manoa (UH Manoa) played a lead role in the design and construction of the iTOP and KLM detectors, in particular their electronic readout. For this purpose, a pair of state-of-the-art Application Specific Integrated Circuits (ASIC) were developed in support for this world class experiment. Details of the TARGET-X ASIC, a 16-channel Giga sample per second (GSPS) digitizer, developed by the Instrumentation Development Laboratory (IDLab), will be presented. I developed automated calibration routines and verified the performance of the ASIC. In addition, the KLM detector readout electronics system was mass produced. I developed fully automated production test software to systematically verify its correct operation. A serial numbering system with barcodes was set in place to properly monitor each sub-readout module and store results in a PostgreSQL database. I will also present the complete readout system, consisting of more than 20000 measurement channels, and its associated electronic system.